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125-150mm EXTERNAL MICROMETER

125-150mm EXTERNAL MICROMETER

编号:KEN3350060K
●产品描述:
Kennedy® External Micrometers

Kennedy® Enamelled Frame External Micrometers for taking external measurements accurately. The alloy steel spindle is held rigid in a drop forged steel frame and is fitted with a speeder type ratchet thimble for rapid adjustment and a fine adjustment thimble for taking precise measurements. The spindle can be locked in position by the using the spindle lock lever this retains the spindle position for reference. The anvils are optically flat tungsten carbide for a hardwearing contact surface that ensures precise measurements every time. Manufactured to BS 870.

Accuracy: Flatness: 0.6mm.
Parallelism: (2 + L/100)mm (fraction rounded down). Instrumental error: +/-(1 + L/75)mm (fraction rounded up).
L = maximum measuring length.

Metric External Micrometers Tungsten Carbide Tipped Anvils

25-50mm EXTERNAL MICROMETER

25-50mm EXTERNAL MICROMETER

编号:KEN3350020K
●产品描述:
Kennedy® External Micrometers

Kennedy® Enamelled Frame External Micrometers for taking external measurements accurately. The alloy steel spindle is held rigid in a drop forged steel frame and is fitted with a speeder type ratchet thimble for rapid adjustment and a fine adjustment thimble for taking precise measurements. The spindle can be locked in position by the using the spindle lock lever this retains the spindle position for reference. The anvils are optically flat tungsten carbide for a hardwearing contact surface that ensures precise measurements every time. Manufactured to BS 870.

Accuracy: Flatness: 0.6mm.
Parallelism: (2 + L/100)mm (fraction rounded down). Instrumental error: +/-(1 + L/75)mm (fraction rounded up).
L = maximum measuring length.

Metric External Micrometers Tungsten Carbide Tipped Anvils

0-25mm EXTERNAL MICROMETER

0-25mm EXTERNAL MICROMETER

编号:KEN3350010K
●产品描述:
Kennedy® External Micrometers

Kennedy® Enamelled Frame External Micrometers for taking external measurements accurately. The alloy steel spindle is held rigid in a drop forged steel frame and is fitted with a speeder type ratchet thimble for rapid adjustment and a fine adjustment thimble for taking precise measurements. The spindle can be locked in position by the using the spindle lock lever this retains the spindle position for reference. The anvils are optically flat tungsten carbide for a hardwearing contact surface that ensures precise measurements every time. Manufactured to BS 870.

Accuracy: Flatness: 0.6mm.
Parallelism: (2 + L/100)mm (fraction rounded down). Instrumental error: +/-(1 + L/75)mm (fraction rounded up).
L = maximum measuring length.

Metric External Micrometers Tungsten Carbide Tipped Anvils

5-6

5-6" EXTERNAL MICROMETER

编号:KEN3350260K
●产品描述:
Kennedy® External Micrometers

Kennedy® Enamelled Frame External Micrometers for taking external measurements accurately. The alloy steel spindle is held rigid in a drop forged steel frame and is fitted with a speeder type ratchet thimble for rapid adjustment and a fine adjustment thimble for taking precise measurements. The spindle can be locked in position by the using the spindle lock lever this retains the spindle position for reference. The anvils are optically flat tungsten carbide for a hardwearing contact surface that ensures precise measurements every time. Manufactured to BS 870.

Accuracy: Flatness: 0.6mm.
Parallelism: (2 + L/100)mm (fraction rounded down). Instrumental error: +/-(1 + L/75)mm (fraction rounded up).
L = maximum measuring length.

Inch Enamelled Frame External Micrometers Tungsten Carbide Tipped Anvils

4-5

4-5" EXTERNAL MICROMETER

编号:KEN3350250K
●产品描述:
Kennedy® External Micrometers

Kennedy® Enamelled Frame External Micrometers for taking external measurements accurately. The alloy steel spindle is held rigid in a drop forged steel frame and is fitted with a speeder type ratchet thimble for rapid adjustment and a fine adjustment thimble for taking precise measurements. The spindle can be locked in position by the using the spindle lock lever this retains the spindle position for reference. The anvils are optically flat tungsten carbide for a hardwearing contact surface that ensures precise measurements every time. Manufactured to BS 870.

Accuracy: Flatness: 0.6mm.
Parallelism: (2 + L/100)mm (fraction rounded down). Instrumental error: +/-(1 + L/75)mm (fraction rounded up).
L = maximum measuring length.

Inch Enamelled Frame External Micrometers Tungsten Carbide Tipped Anvils

100-125mm EXTERNAL MICROMETER

100-125mm EXTERNAL MICROMETER

编号:KEN3350050K
●产品描述:
Kennedy® External Micrometers

Kennedy® Enamelled Frame External Micrometers for taking external measurements accurately. The alloy steel spindle is held rigid in a drop forged steel frame and is fitted with a speeder type ratchet thimble for rapid adjustment and a fine adjustment thimble for taking precise measurements. The spindle can be locked in position by the using the spindle lock lever this retains the spindle position for reference. The anvils are optically flat tungsten carbide for a hardwearing contact surface that ensures precise measurements every time. Manufactured to BS 870.

Accuracy: Flatness: 0.6mm.
Parallelism: (2 + L/100)mm (fraction rounded down). Instrumental error: +/-(1 + L/75)mm (fraction rounded up).
L = maximum measuring length.

Metric External Micrometers Tungsten Carbide Tipped Anvils

2-3

2-3" EXTERNAL MICROMETER

编号:KEN3350230K
●产品描述:
Kennedy® External Micrometers

Kennedy® Enamelled Frame External Micrometers for taking external measurements accurately. The alloy steel spindle is held rigid in a drop forged steel frame and is fitted with a speeder type ratchet thimble for rapid adjustment and a fine adjustment thimble for taking precise measurements. The spindle can be locked in position by the using the spindle lock lever this retains the spindle position for reference. The anvils are optically flat tungsten carbide for a hardwearing contact surface that ensures precise measurements every time. Manufactured to BS 870.

Accuracy: Flatness: 0.6mm.
Parallelism: (2 + L/100)mm (fraction rounded down). Instrumental error: +/-(1 + L/75)mm (fraction rounded up).
L = maximum measuring length.

Inch Enamelled Frame External Micrometers Tungsten Carbide Tipped Anvils

SMS230 MICROMETER STAND

SMS230 MICROMETER STAND

编号:KEN3357230M
●产品描述:
Kennedy® Micrometer Stand - Standard Type

Made of cast iron, it is designed for use with most standard micrometers up to 100mm (4"). The clamp has positive angular and padded parallel clamping jaws.



0-1

0-1" EXTERNAL MICROMETER

编号:KEN3350210K
●产品描述:
Kennedy® External Micrometers

Kennedy® Enamelled Frame External Micrometers for taking external measurements accurately. The alloy steel spindle is held rigid in a drop forged steel frame and is fitted with a speeder type ratchet thimble for rapid adjustment and a fine adjustment thimble for taking precise measurements. The spindle can be locked in position by the using the spindle lock lever this retains the spindle position for reference. The anvils are optically flat tungsten carbide for a hardwearing contact surface that ensures precise measurements every time. Manufactured to BS 870.

Accuracy: Flatness: 0.6mm.
Parallelism: (2 + L/100)mm (fraction rounded down). Instrumental error: +/-(1 + L/75)mm (fraction rounded up).
L = maximum measuring length.

Inch Enamelled Frame External Micrometers Tungsten Carbide Tipped Anvils

1-2

1-2" EXTERNAL MICROMETER

编号:KEN3350220K
●产品描述:
Kennedy® External Micrometers

Kennedy® Enamelled Frame External Micrometers for taking external measurements accurately. The alloy steel spindle is held rigid in a drop forged steel frame and is fitted with a speeder type ratchet thimble for rapid adjustment and a fine adjustment thimble for taking precise measurements. The spindle can be locked in position by the using the spindle lock lever this retains the spindle position for reference. The anvils are optically flat tungsten carbide for a hardwearing contact surface that ensures precise measurements every time. Manufactured to BS 870.

Accuracy: Flatness: 0.6mm.
Parallelism: (2 + L/100)mm (fraction rounded down). Instrumental error: +/-(1 + L/75)mm (fraction rounded up).
L = maximum measuring length.

Inch Enamelled Frame External Micrometers Tungsten Carbide Tipped Anvils